On December 7th, 2007, a delegation from Shanghai Institute of Applied Physics (SINAP) and Shanghai Synchrotron Radiation Facility (SSRF) visited ION, members included:
Dr. Jun Hu, Deputy Director and Investigator of SINAP
Dr. Ren-Zhong Tai, Investigator of SINAP & SSRF
Dr. Xiao-Han Yu, Investigator of SINAP
Dr. Qing Huang, Investigator of SINAP

Drs. Tai and Yu gave talks entitled “Technology and application of SSRF Soft X-ray microscope.” and “Synchrotron based Hard X-ray microprobe and microscope.” After the presentations, the delegation and some ION PIs discussed the prospects of future collaborations between ION and SSRF.